DocumentCode :
809905
Title :
Comparison of measured and computed conversion loss from a resonant tunneling device multiplier
Author :
Sammut, Charles V. ; Cronin, Nigel J.
Author_Institution :
Dept. of Phys., Malta Univ., Msida, Malta
Volume :
2
Issue :
12
fYear :
1992
Firstpage :
486
Lastpage :
488
Abstract :
The behavior of a resonant tunneling device (RTD) as a multiplier over a range of bias voltage is investigated. The experimental results agree well with large-signal simulations based on a simple equivalent circuit with element values derived from the I-V characteristic and low-frequency small-signal impedance measurements. This technique can be extended to assist in the design and realization of millimeter and submillimeter RTD multipliers.<>
Keywords :
equivalent circuits; frequency multipliers; losses; resonant tunnelling devices; solid-state microwave circuits; tunnel diodes; I-V characteristic; LF measurements; RTD multipliers; bias voltage; conversion loss; equivalent circuit; large-signal simulations; resonant tunneling device; small-signal impedance measurements; Capacitance-voltage characteristics; Equivalent circuits; Frequency domain analysis; Impedance measurement; Loss measurement; Packaging; Physics; Power system harmonics; Resonant tunneling devices; Voltage;
fLanguage :
English
Journal_Title :
Microwave and Guided Wave Letters, IEEE
Publisher :
ieee
ISSN :
1051-8207
Type :
jour
DOI :
10.1109/75.173403
Filename :
173403
Link To Document :
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