• DocumentCode
    810488
  • Title

    Modeling and simulation of interconnection delays and crosstalks in high-speed integrated circuits

  • Author

    Gao, David S. ; Yang, Andrew T. ; Kang, Sung Mo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    37
  • Issue
    1
  • fYear
    1990
  • fDate
    1/1/1990 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    A computer model for n parallel microstrip lines is developed for circuit simulation. This model for the lossy transmission line system can be readily implemented into circuit simulators and can accurately simulate the delay and crosstalk effects of interconnects in high-speed integrated circuits. Modal analysis is applied to decouple the n-coupled-line system into n independent lines, and the characteristic solutions of telegraph equations are represented by a set of simple time-varying equivalent circuits. The model has been implemented in a general-purpose circuit simulator, iSMILE, which is compatible with SPICE. Simulation results on propagation delay times and crosstalk are presented for high-speed GaAs HEMT (high-electron-mobility transistor) integrated circuits
  • Keywords
    circuit analysis computing; crosstalk; delays; digital integrated circuits; equivalent circuits; field effect integrated circuits; GaAs; HEMT IC; MESFET IC; characteristic solutions; circuit simulation; computer model; crosstalks; general-purpose circuit simulator; high-electron-mobility transistor; high-speed integrated circuits; iSMILE; interconnection delays; lossy transmission line system; modal analysis; parallel microstrip lines; propagation delay times; telegraph equations; time-varying equivalent circuits; Circuit simulation; Computational modeling; Concurrent computing; Crosstalk; Delay; HEMTs; High speed integrated circuits; Integrated circuit interconnections; Integrated circuit modeling; Microstrip;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/31.45685
  • Filename
    45685