DocumentCode
81213
Title
Addendum to “Modeling MOSFET Drain Current Non-Gaussian Distribution With Power-Normal Probability Density Function” [Feb 14 154-156]
Author
Yu, Bei ; Yuan, Yuan
Author_Institution
Qualcomm Technologies Inc., San Diego, CA, USA
Volume
35
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
883
Lastpage
883
Abstract
In our paper “Modeling MOSFET Drain Current Non-Gaussian Distribution with Power-Normal Probability Density Function” [1] published in IEEE Electron Device Letters , Feburary 2014, the analytic results are derived for power Gaussian distribution (PGD) with integer
only. It appears to be a limitation in practical application, where one may need non-integer
for a more accurate model, e.g.,
. This addendum is to show that our analytic results, without any format change, are also applicable to non-integer
. Therefore, the integer limitation can be stripped off from our model, which in fact is capable of providing continuous coverage.
Keywords
MOSFET; Monte Carlo methods; Probability density function; SRAM chips; Silicon;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2014.2331067
Filename
6849448
Link To Document