• DocumentCode
    81213
  • Title

    Addendum to “Modeling MOSFET Drain Current Non-Gaussian Distribution With Power-Normal Probability Density Function” [Feb 14 154-156]

  • Author

    Yu, Bei ; Yuan, Yuan

  • Author_Institution
    Qualcomm Technologies Inc., San Diego, CA, USA
  • Volume
    35
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    883
  • Lastpage
    883
  • Abstract
    In our paper “Modeling MOSFET Drain Current Non-Gaussian Distribution with Power-Normal Probability Density Function” [1] published in IEEE Electron Device Letters, Feburary 2014, the analytic results are derived for power Gaussian distribution (PGD) with integer (n) only. It appears to be a limitation in practical application, where one may need non-integer (n) for a more accurate model, e.g., (n=1.5) . This addendum is to show that our analytic results, without any format change, are also applicable to non-integer (n) . Therefore, the integer limitation can be stripped off from our model, which in fact is capable of providing continuous coverage.
  • Keywords
    MOSFET; Monte Carlo methods; Probability density function; SRAM chips; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2331067
  • Filename
    6849448