DocumentCode
812475
Title
Improving Error Tolerance for Multithreaded Register Files
Author
Wang, Lei ; Patel, Niral
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT
Volume
16
Issue
8
fYear
2008
Firstpage
1009
Lastpage
1020
Abstract
Chip multithreaded computing is exposed to the dual challenges of increasing system complexity and error sensitivity. It is critical to develop effective solutions that achieve better error tolerance without inducing performance degradation. In this paper, we propose a new error-tolerant memory design based on a unique computing phenomenon referred to as the dynamic multithreading redundancy (DMR). The proposed technique exploits the interplay between the concurrent threads for runtime error control. We also present two DMR enhancements, immediate write-back and self-recovery, to address the error accumulation effect. A multithreaded register file was implemented to demonstrate the proposed DMR technique. Simulation results on the SPEC CPU2000 benchmarks demonstrate significant overhead reduction in performance and energy efficiency related to error recovery. In addition, the proposed technique features good scalability with respect to the instruction-level and thread-level parallelism for next-generation processor design, where the soft error problem is expected to get worse due to technology scaling and architecture-affecting trends.
Keywords
fault tolerant computing; integrated circuit design; integrated memory circuits; multi-threading; system recovery; SPEC CPU2000 benchmarks; chip multithreaded computing; concurrent threads; dynamic multithreading redundancy; error recovery; error sensitivity; error-tolerant memory design; instruction-level parallelism; multithreaded register files; next-generation processor design; overhead reduction; runtime error control; system complexity; thread-level parallelism; Degradation; Energy efficiency; Error correction; Multithreading; Parallel processing; Redundancy; Registers; Runtime; Scalability; Error tolerance; VLSI design; memory circuits; register files; soft errors;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2008.2000521
Filename
4570470
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