DocumentCode :
813341
Title :
Multilayer contact material based on copper and chromium material and its interruption ability
Author :
Fink, Harald ; Gentsch, Dietmar ; Heimbach, Markus
Volume :
31
Issue :
5
fYear :
2003
Firstpage :
973
Lastpage :
976
Abstract :
Contact material based on copper and chromium (CuCr) is widely used for vacuum interrupters (VIs) and has found worldwide acceptance in medium-voltage applications, especially for high-current interruption. Contact material with a weight content of chromium between 25 and 60 wt.% is almost exclusively used. A new contact material was established based on a multilayer system to improve the interruption ability and mechanical properties and reduce the contact resistance. After a combined sintering and melting process in a high-vacuum furnace, a material of high density and low gas content is produced. The finished blank consists of the following layers: CuCr-sheathing, copper bulk material, and a stainless-steel support resulting from the lost mold. It turned out that the higher thermal and electrical conductivity as well as mechanical properties of the multilayer contact material improved the interruption ability of the VI. Investigations of switching behaviors were carried out in standard VIs. Additionally, the standard chromium content of 25 wt.% in CuCr and the influence of higher chromium content was investigated with respect to interruption ability. Afterwards, the microstructure on the contact surface was analyzed with scanning electron microscopy and energy dispersive X-ray.
Keywords :
X-ray chemical analysis; chromium; copper; scanning electron microscopy; vacuum interrupters; Cr; Cu; CuCr; CuCr-sheathing; contact resistance; electrical conductivity; energy dispersive X-ray; finished blank; high-current interruption; high-vacuum furnace; interruption ability; mechanical properties; medium-voltage applications; melting process; multilayer contact material; multilayer system; scanning electron microscopy; sintering process; stainless-steel support; thermal conductivity; Chromium; Conducting materials; Contact resistance; Copper; Furnaces; Interrupters; Mechanical factors; Medium voltage; Nonhomogeneous media; Thermal conductivity;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2003.818425
Filename :
1240045
Link To Document :
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