Room temperature measurement of the anisotropic loss tangent of sapphire using the whispering gallery mode technique

Author

Hartnett, John G. ; Tobar, Michael E. ; Ivanov, Eugene N. ; Krupka, Jerzy

Author_Institution

Sch. of Phys., Western Australia Univ., Crawley, WA, Australia

Volume

53

Issue

1

fYear

2006

Firstpage

34

Lastpage

38

Abstract

The anisotropic loss tangent has been determined in monocrystalline sapphire for components parallel and perpendicular to the crystal axis, using the whispering gallery (WG) mode method. The Q-factors of quasi-TE and quasi-TM modes were measured precisely in four cylindrical sapphire resonators at room temperature, from which was determined a maximum attainable Q-factor of (2.1 /spl plusmn/ 0.2) /spl times/ 10/sup 5/ at 9 GHz in a quasi-TM mode. Sapphire dielectric material from three different manufacturers was compared over the 270-345 K temperature range and the 5-16 GHz frequency range.

Keywords

anisotropic media; dielectric materials; dielectric resonators; sapphire; temperature measurement; whispering gallery modes; 270 to 345 K; 5 to 16 GHz; 9 GHz; anisotropic loss tangent; dielectric material; monocrystalline sapphire; room temperature measurement; sapphire resonators; whispering gallery mode technique; Anisotropic magnetoresistance; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Oscillators; Phase noise; Q factor; Temperature measurement; Whispering gallery modes;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2006.1588389

Filename

1588389