Title :
Fast parametric elastic image registration
Author :
Kybic, Jan ; Unser, Michael
Author_Institution :
Biomed. Imaging Group, Swiss Fed. Inst. of Technol. Lausanne, Switzerland
Abstract :
We present an algorithm for fast elastic multidimensional intensity-based image registration with a parametric model of the deformation. It is fully automatic in its default mode of operation. In the case of hard real-world problems, it is capable of accepting expert hints in the form of soft landmark constraints. Much fewer landmarks are needed and the results are far superior compared to pure landmark registration. Particular attention has been paid to the factors influencing the speed of this algorithm. The B-spline deformation model is shown to be computationally more efficient than other alternatives. The algorithm has been successfully used for several two-dimensional (2-D) and three-dimensional (3-D) registration tasks in the medical domain, involving MRI, SPECT, CT, and ultrasound image modalities. We also present experiments in a controlled environment, permitting an exact evaluation of the registration accuracy. Test deformations are generated automatically using a random hierarchical fractional wavelet-based generator.
Keywords :
biomedical MRI; biomedical ultrasonics; computerised tomography; image registration; image resolution; medical image processing; reviews; splines (mathematics); wavelet transforms; 2D registration; 3D registration; B-spline deformation model; CT; MRI; SPECT; algorithm speed; fast parametric elastic image registration; landmark registration; multidimensional intensity-based image registration; multiresolution approach; parametric model; random hierarchical fractional wavelet-based generator; real-world problems; registration accuracy; semi-automatic registration; soft landmark constraints; three-dimensional registration; two-dimensional registration; ultrasound image; Biomedical imaging; Computed tomography; Deformable models; Image registration; Magnetic resonance imaging; Multidimensional systems; Parametric statistics; Spline; Two dimensional displays; Ultrasonic imaging;
Journal_Title :
Image Processing, IEEE Transactions on
DOI :
10.1109/TIP.2003.813139