CYCLOGEN: automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation

Author

Bechir, Ayari ; Kaminska, Bozena

Author_Institution

Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

Volume

42

Issue

7

fYear

1995

fDate

7/1/1995 12:00:00 AM

Firstpage

446

Lastpage

452

Abstract

In this paper we have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for single-output and multioutput electronic circuits. This measure computes the number of BDD paths to be transformed into test vectors. This new test generation approach, called CYCLOGEN, has been implemented, and the tests for several functional primitives, as well as the ISCAS-85 benchmark circuits, have been generated successfully. The results show that this approach is effective and promising

Keywords

Boolean functions; automatic test software; combinational circuits; integrated circuit testing; logic testing; Boolean function manipulation; CYCLOGEN; ROBDD representation; automatic test generator; binary decision diagram; cyclomatic complexity measure; functional test generation; reduced ordered BDD; test vectors; Automatic testing; Benchmark testing; Binary decision diagrams; Boolean functions; Circuit faults; Circuit testing; Data structures; Design automation; Electronic circuits; Logic testing;

fLanguage

English

Journal_Title

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7130

Type

jour

DOI

10.1109/82.401167

Filename

401167