DocumentCode
815281
Title
Modeling and design of a novel high-sensitivity electric field silicon-on-insulator sensor based on a whispering-gallery-mode resonator
Author
Passaro, Vittorio M N ; De Leonardis, Francesco
Author_Institution
Dipt. di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
Volume
12
Issue
1
fYear
2006
Firstpage
124
Lastpage
133
Abstract
In this paper, we present the modeling and design of a new approach to a miniaturized electric field sensor, based on a whispering-gallery-mode resonator coupled with a Fabry-Perot cavity in silicon-on-insulator technology. The sensing element consists of a metal oxide semiconductor capacitor, optimized to achieve high electrical sensitivity and low optical losses. The theoretical model of the whole sensor architecture includes the influence of all electrical and optical parameters, including thin oxide thickness, silicon and polysilicon doping concentration, optical losses due to propagation, absorption and scattering, wavelength and amplitude characteristics of the architecture, charge accumulation effects in the capacitor, and thermal effects. The very high sensitivity of this device, demonstrated by simulations, is due to the simultaneous influence of the two coupled resonators and the metal oxide semiconductor structure.
Keywords
MOS capacitors; electric field measurement; impurity distribution; integrated optics; optical design techniques; optical losses; optical resonators; optical sensors; silicon-on-insulator; whispering gallery modes; Fabry-Perot cavity; charge accumulation effects; coupled resonators; electric field sensor; electrical sensitivity; high-sensitivity sensor; metal oxide semiconductor capacitor; miniaturized sensor; optical absorption; optical losses; optical propagation; optical scattering; polysilicon doping concentration; sensor design; sensor modeling; silicon doping concentration; silicon-on-insulator sensor; silicon-on-insulator technology; thermal effects; thin oxide thickness; whispering-gallery-mode resonator; Capacitive sensors; Capacitors; Fabry-Perot; Optical losses; Optical resonators; Optical scattering; Optical sensors; Semiconductor process modeling; Sensor phenomena and characterization; Silicon on insulator technology; Electric field measurement; MOS capacitors; modeling; optical losses; optical waveguide components; resonators; silicon-on-insulator technology;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2005.862950
Filename
1588891
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