Title :
Modeling and design of a novel high-sensitivity electric field silicon-on-insulator sensor based on a whispering-gallery-mode resonator
Author :
Passaro, Vittorio M N ; De Leonardis, Francesco
Author_Institution :
Dipt. di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
Abstract :
In this paper, we present the modeling and design of a new approach to a miniaturized electric field sensor, based on a whispering-gallery-mode resonator coupled with a Fabry-Perot cavity in silicon-on-insulator technology. The sensing element consists of a metal oxide semiconductor capacitor, optimized to achieve high electrical sensitivity and low optical losses. The theoretical model of the whole sensor architecture includes the influence of all electrical and optical parameters, including thin oxide thickness, silicon and polysilicon doping concentration, optical losses due to propagation, absorption and scattering, wavelength and amplitude characteristics of the architecture, charge accumulation effects in the capacitor, and thermal effects. The very high sensitivity of this device, demonstrated by simulations, is due to the simultaneous influence of the two coupled resonators and the metal oxide semiconductor structure.
Keywords :
MOS capacitors; electric field measurement; impurity distribution; integrated optics; optical design techniques; optical losses; optical resonators; optical sensors; silicon-on-insulator; whispering gallery modes; Fabry-Perot cavity; charge accumulation effects; coupled resonators; electric field sensor; electrical sensitivity; high-sensitivity sensor; metal oxide semiconductor capacitor; miniaturized sensor; optical absorption; optical losses; optical propagation; optical scattering; polysilicon doping concentration; sensor design; sensor modeling; silicon doping concentration; silicon-on-insulator sensor; silicon-on-insulator technology; thermal effects; thin oxide thickness; whispering-gallery-mode resonator; Capacitive sensors; Capacitors; Fabry-Perot; Optical losses; Optical resonators; Optical scattering; Optical sensors; Semiconductor process modeling; Sensor phenomena and characterization; Silicon on insulator technology; Electric field measurement; MOS capacitors; modeling; optical losses; optical waveguide components; resonators; silicon-on-insulator technology;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2005.862950