• DocumentCode
    815451
  • Title

    High-power highly-reliable operation of 0.98-μm InGaAs-InGaP strain-compensated single-quantum-well lasers with tensile-strained InGaAsP barriers

  • Author

    Sagawa, M. ; Toyonaka, T. ; Hiramoto, K. ; Shinoda, K. ; Uomi, K.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    1
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    We compared 0.98-μm lasers with a strain-compensated active layer consisting of a compressive InGaAs well and tensile-strained InGaAsP barriers with identical lasers that have a conventional active layer with GaAs barriers. It was shown that the lasers with InGaAsP barriers have better temperature characteristics due to the larger energy gap difference between a well and barriers. Because of the high characteristic temperature, 200-mW operation was obtained with the InGaAsP-barrier laser even at 90°C without any significant deterioration. We also showed that the operation of the lasers with a strain-compensated active layer was highly reliable. The degradation rate of these lasers was four times smaller than that of the lasers with GaAs barriers due to the better crystal quality in their active laser. The estimated lifetime at 25°C for the lasers with a strain-compensated active layer was more than 170000 hours
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser beams; quantum well lasers; 0.98 mum; 200 mW; 25 C; 90 C; InGaAs-InGaP; InGaAs-InGaP laser; InGaAsP; InGaAsP barriers; active layer; degradation rate; energy gap difference; high-power highly-reliable operation; strain-compensated active layer; strain-compensated single-quantum-well lasers; Carrier confinement; Degradation; Fiber lasers; Gallium arsenide; Gas lasers; Indium gallium arsenide; Lattices; Quantum well lasers; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.401196
  • Filename
    401196