• DocumentCode
    815558
  • Title

    A new technique for measuring the constitutive parameters of planar materials

  • Author

    Scott, Waymond R., Jr.

  • Author_Institution
    Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    41
  • Issue
    5
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    639
  • Lastpage
    645
  • Abstract
    A technique for measuring the constitutive parameters of materials over a broad range of frequencies is developed. The technique is specifically designed for planar samples. Planar samples can be placed in the measurement fixture without any special preparation; this makes the technique more convenient than other techniques which require that the sample has to be machined to fit into a measurement fixture. Using fourth-order elements, the finite-element method provides a general, very accurate solution. The technique is experimentally verified by measuring the constitutive parameters of two materials with known properties. The measured results are compared to those of other investigators and are shown to be in good agreement
  • Keywords
    finite element analysis; permittivity measurement; Al2O3; Teflon; alumina; complex permeability; complex permittivity measurement; constitutive parameters; finite-element method; fourth-order elements; organic compounds; planar materials; Coaxial components; Conducting materials; Finite element methods; Fixtures; Frequency measurement; Permeability measurement; Permittivity measurement; Reflection; TV; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.177335
  • Filename
    177335