DocumentCode
815558
Title
A new technique for measuring the constitutive parameters of planar materials
Author
Scott, Waymond R., Jr.
Author_Institution
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
41
Issue
5
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
639
Lastpage
645
Abstract
A technique for measuring the constitutive parameters of materials over a broad range of frequencies is developed. The technique is specifically designed for planar samples. Planar samples can be placed in the measurement fixture without any special preparation; this makes the technique more convenient than other techniques which require that the sample has to be machined to fit into a measurement fixture. Using fourth-order elements, the finite-element method provides a general, very accurate solution. The technique is experimentally verified by measuring the constitutive parameters of two materials with known properties. The measured results are compared to those of other investigators and are shown to be in good agreement
Keywords
finite element analysis; permittivity measurement; Al2O3; Teflon; alumina; complex permeability; complex permittivity measurement; constitutive parameters; finite-element method; fourth-order elements; organic compounds; planar materials; Coaxial components; Conducting materials; Finite element methods; Fixtures; Frequency measurement; Permeability measurement; Permittivity measurement; Reflection; TV; Transmission line measurements;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.177335
Filename
177335
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