DocumentCode :
815595
Title :
Ultralow-threshold sapphire substrate-bonded top-emitting 850-nm VCSEL array
Author :
Liu, Jason J. ; Riely, B. ; Shen, P.H. ; Das, N. ; Newman, P. ; Chang, W. ; Simonis, G.
Author_Institution :
Sensors & Electron Devices Directorate, US Army Res. Lab., Adelphi, MD, USA
Volume :
14
Issue :
9
fYear :
2002
Firstpage :
1234
Lastpage :
1236
Abstract :
Oxide-confined top-emitting vertical-cavity surface-emitting-laser (VCSEL) 8 × 8 arrays were designed and fabricated with ultralow thresholds. The arrays were flip-chip bonded onto sapphire substrates and mounted in pin-grid-array packages as optical transmitter arrays. By using the offset-contact bonding process, we were able to obtain very high yield for hybridized devices without damaging the VCSEL mesas. Room-temperature lasing thresholds below 70 μA were found from some of these packaged VCSELs with measured oxide apertures 2.6 μm in diameter. The emission spectrum at an injection current of 70 μA showed a full-width at half-maximum linewidth of less than 2.5 A. Polarization properties were also confirmed from the output of the device. The superior performance was attributed to the optimized size and placement of the confinement aperture and the precise alignment of the gain profile of the active region to the mode of the resonant cavity.
Keywords :
flip-chip devices; integrated optoelectronics; laser cavity resonators; optical transmitters; quantum well lasers; semiconductor device packaging; semiconductor laser arrays; surface emitting lasers; 2.6 micron; 70 muA; 850 nm; Al/sub 0.9/Ga/sub 0.1/As-Al/sub 0.16/Ga/sub 0.84/As; Al/sub 2/O/sub 3/; CMOS circuitry; GaAs quantum wells; GaAs-Al/sub 0.3/Ga/sub 0.7/As; active region; confinement aperture; emission spectrum; flip-chip bonding; full-width at half-maximum linewidth; gain profile alignment; hybridized devices; injection current; offset-contact bonding process; optical transmitter arrays; oxide aperture diameter; oxide-confined top-emitting vertical-cavity surface-emitting-laser arrays; packaged VCSELs; pin-grid-array packages; polarization properties; resonant cavity mode; room-temperature lasing thresholds; sapphire substrates; ultralow thresholds; ultralow-threshold sapphire substrate-bonded top-emitting 850-nm VCSEL array; very high yield; Apertures; Bonding processes; Distributed Bragg reflectors; Driver circuits; Gallium arsenide; Optical arrays; Optical transmitters; Packaging; Substrates; Vertical cavity surface emitting lasers;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2002.801093
Filename :
1032337
Link To Document :
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