DocumentCode
816042
Title
The Spherical Drift Chamber for X-Ray Imaging Applications
Author
Charpak, G. ; Hajduk, Z. ; Jeavons, A. ; Kahn, R. ; Stubbs, R.
Author_Institution
CERN, Geneva, Switzerland
Volume
22
Issue
1
fYear
1975
Firstpage
269
Lastpage
271
Abstract
Properties of proportional chambers with spherical drift spaces have been investigated. An experiment of X-ray diffraction in crystals shows that an accuracy of 0.5 mm, at 20° inclination with respect to the axis of the chamber, can be obtained with 4 cm of drift length. Such chambers have many applications: X-ray diffraction patterns, pin-hole imaging, angular distributions of cascades of X-rays in nuclear physics, etc.
Keywords
Argon; Cathodes; Crystals; Electrodes; Geometry; Testing; Wire; X-ray diffraction; X-ray imaging; Xenon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1975.4327649
Filename
4327649
Link To Document