DocumentCode :
816103
Title :
Interval methods for modeling uncertainty in RC timing analysis
Author :
Harkness, Cheryl L. ; Lopresti, Daniel P.
Author_Institution :
Dept. of Comput. Sci., Brown Univ., Providence, RI, USA
Volume :
11
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
1388
Lastpage :
1401
Abstract :
The authors propose representing uncertain parameters as intervals and present a theoretical framework based on interval algebra for manipulating these ranges. To illustrate this methodology, they modify an existing RC analysis algorithm (Crystal´s PR-Slope model) to create one which computes worst-case delay bounds when given uncertain input parameters. They provide proofs of correctness for the approach and test its performance. Two alternate interval-based techniques which produce even tighter bounds than the original approach are also presented. When compared to Monte Carlo simulation, the interval methods are more precise and significantly faster
Keywords :
MOS integrated circuits; VLSI; circuit analysis computing; delays; NMOS; PR-Slope model; RC analysis algorithm; RC timing analysis; VLSI design; interval algebra; interval methods; interval-based techniques; sequential MOS VLSI; timing verification; uncertain input parameters; worst-case delay bounds; CMOS technology; Capacitance; Circuits; Delay; Fabrication; MOS devices; Manufacturing processes; Timing; Uncertainty; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.177402
Filename :
177402
Link To Document :
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