• DocumentCode
    816183
  • Title

    Performance and Stability of Large-Area 4H-SiC 10-kV Junction Barrier Schottky Rectifiers

  • Author

    Hull, Brett A. ; Sumakeris, Joseph J. ; O´Loughlin, Michael J. ; Zhang, Qingchun ; Richmond, Jim ; Powell, Adrian R. ; Imhoff, Eugene A. ; Hobart, Karl D. ; Rivera-López, Angel ; Hefner, Allen R., Jr.

  • Author_Institution
    Cree, Inc., Durham, NC
  • Volume
    55
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1864
  • Lastpage
    1870
  • Abstract
    The forward and reverse bias dc characteristics, the long-term stability under forward and reverse bias, and the reverse recovery performance of 4H-SiC junction barrier Schottky (JBS) diodes that are capable of blocking in excess of 10 kV with forward conduction of up to 10 A at a forward voltage of less than 3.5 V (at 25degC) are described. The diodes show a positive temperature coefficient of resistance and a stable Schottky barrier height of up to 200degC. The diodes show stable operation under continuous forward current injection at 20 A/cm2 and under continuous reverse bias of 8 kV at 125degC. When switched from a 10-A forward current to a blocking voltage of 3 kV at a current rate-of-fall of 30 A/mus, the reverse recovery time and the reverse recovery charge are nearly constant at 300 ns and 425 nC, respectively, over the entire temperature range of 25degC-175degC.
  • Keywords
    III-V semiconductors; Schottky diodes; rectifiers; silicon compounds; Schottky rectifiers; SiC; bias dc characteristics; current 10 A; junction barrier; long term stability; positive temperature coefficient; reverse recovery charge; reverse recovery time; temperature 25 degC to 175 degC; voltage 10 kV; voltage 3 kV; voltage 8 kV; Inverters; MOSFET circuits; Power dissipation; Rectifiers; Schottky barriers; Schottky diodes; Semiconductor diodes; Silicon carbide; Stability; Voltage; Junction barrier Schottky (JBS) diode; SiC; power semiconductor diode; stability;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.926655
  • Filename
    4578854