High energy proton SEU test results for the commercially available MIPS R3000 microprocessor and R3010 floating point unit

Author

Shaeffer, D.L. ; Kimbrough, J.R. ; Denton, S.M. ; Kaschmitter, J.L. ; Wilburn, J.W. ; Davis, R.W. ; Colella, N.J. ; Holtkamp, D.B.

Author_Institution

Lawrence Livermore Nat. Lab., CA, USA

Volume

38

Issue

6

fYear

1991

fDate

12/1/1991 12:00:00 AM

Firstpage

1421

Lastpage

1428

Abstract

Proton single event upset (SEU) cross sections and proton total dose hardness of commercially available MIPS R3000 microprocessors (CPU) and R3010 floating point units (FPU) were obtained by exposing these parts to 256 MeV protons from the linear accelerator (LINAC) at the Los Alamos Meson Physics Facility (LAMPF). Parts from several manufacturers were tested. The CPUs and FPUs were tested dynamically during radiation exposure with specially designed assembly language codes which exercised a subset of the available instructions. Cross sections derived from the SEU data were used to calculate expected upset rates for a 500-km, 60-degree inclination orbit during quiet solar conditions and during the August 4. 1972, King solar fire event modeled by J.H. Adams et al. (1981)

Keywords

digital arithmetic; environmental testing; integrated circuit testing; microprocessor chips; proton effects; 256 MeV; King solar fire event; LINAC; MIPS R3000 microprocessor; MIPS R3010 floating point unit; SEU cross sections; assembly language codes; dynamic testing; high energy proton SEU testing; proton total dose hardness; quiet solar conditions; single event upset; upset rates; Assembly; Linear accelerators; Linear particle accelerator; Manufacturing; Mesons; Microprocessors; Physics; Protons; Single event upset; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.124127

Filename

124127