DocumentCode :
817511
Title :
Identification of Essential Coupling Path Models for Conducted EMI Prediction in Switching Power Converters
Author :
Jin, Meng ; Weiming, Ma ; Qijun, Pan ; Jun, Kang ; Lei, Zhang ; Zhihua, Zhao
Author_Institution :
Res. Inst. of Power Electron. Technol., Naval Univ. of Eng., Wuhan
Volume :
21
Issue :
6
fYear :
2006
Firstpage :
1795
Lastpage :
1803
Abstract :
A knowledge of conducted electromagnetic interference (EMI) generation and propagation mechanisms can aid the engineers working in the field of electromagnetic compatibility (EMC). This paper presents a method, called essential coupling path models, to investigate the conducted EMI coupling in switching power converters. Three modes of conducted EMI noise: the mixed-mode (MM), the intrinsic-differential-mode (IDM), and the common-mode (CM) are identified by time domain measurements associated with an ac-dc half-bridge converter. The derived models assume that the lumped parameters´ circuits represent the noise generation and propagation paths that allow easy physical interpretations. The experimental results show good agreement by the comparison of measured and predicted MM, IDM, and CM noise emissions with filter included. The proposed method is easy to apply in practice for understanding, diagnosis, and evaluation of EMI behavior
Keywords :
AC-DC power convertors; bridge circuits; circuit noise; electromagnetic interference; interference suppression; lumped parameter networks; mixed analogue-digital integrated circuits; switching convertors; time-domain analysis; AC-DC half-bridge converters; EMI prediction conduction; common-mode noise emissions; electromagnetic interference; intrinsic-differential-mode; lumped parameter circuits; mixed-mode circuits; propagation mechanisms; switching power converters; time-domain measurements; Circuit noise; Coupling circuits; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Electromagnetic propagation; Knowledge engineering; Noise measurement; Predictive models; Switching converters; Conducted electromagnetic interference (EMI); coupling impedances; essential coupling path; lumped circuit models; noise sources; switching power converters;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2006.882905
Filename :
4012146
Link To Document :
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