• DocumentCode
    817876
  • Title

    A new circuit augmentation method for modeling of interconnects and passive components

  • Author

    Kolstad, Joel ; Blevins, Chris ; Dunn, John M. ; Weisshaar, Andreas

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
  • Volume
    29
  • Issue
    1
  • fYear
    2006
  • Firstpage
    67
  • Lastpage
    77
  • Abstract
    This paper presents a new methodology for automated broadband model generation from S-parameter data for interconnects and passive components. The new methodology is based on augmenting an existing equivalent circuit model with a macromodel (black-box) network described by rational functions while simultaneously perturbing the equivalent circuit component values. The macromodel network is determined using standard least-squares or vector-fitting approaches. The perturbation of the equivalent circuit parameter values is achieved during the macromodel generation by means of global optimization based on intelligent search algorithms. The new approach is demonstrated on several two-port test example structures including a broadband probe tip structure and a CMOS spiral inductor.
  • Keywords
    S-parameters; circuit simulation; equivalent circuits; integrated circuit interconnections; integrated circuit modelling; CMOS spiral inductor; S-parameter data; broadband probe tip structure; circuit augmentation; circuit simulation; equivalent circuit model; intelligent search algorithms; interconnect modeling; least squares approach; macromodel network; passive components; rational functions; vector fitting approach; Circuit simulation; Circuit testing; Computational modeling; Convolution; Equivalent circuits; Frequency domain analysis; Integrated circuit interconnections; Probes; SPICE; Scattering parameters; Circuit simulation; equivalent circuit; interconnect; macromodel; passive device; passivity; rational function approximation;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.862643
  • Filename
    1589133