Title :
SEU flight data from the CRRES MEP
Author :
Campbell, Arthur B.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fDate :
12/1/1991 12:00:00 AM
Abstract :
Analysis of single event upset data from the CRRES MEP from 27 July 1990 through 26 March 1991 has shown that upsets are being observed each orbit, the 93422 and 93L422 bipolar RAMs are the most sensitive devices, proton upsets in the radiation belts predominate over cosmic ray upsets, and many devices exhibit multiple bit upsets
Keywords :
artificial satellites; bipolar integrated circuits; integrated memory circuits; proton effects; radiation belts; random-access storage; AD 1990 07 27 to 1991 03 26; CRRES MEP; bipolar RAMs; cosmic ray upsets; multiple bit upsets; proton upsets; radiation belts; single event upset data; Belts; Circuit testing; Clocks; Extraterrestrial measurements; Laboratories; Protons; Radiation effects; Read-write memory; Satellites; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
