DocumentCode :
817968
Title :
Techniques for minimizing space proton damage in scientific charge coupled devices
Author :
Holland, Andrew ; Holmes-Siedle, Andrew ; Johlander, Bengt ; Adams, Leonard
Author_Institution :
Leicester Univ., UK
Volume :
38
Issue :
6
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
1663
Lastpage :
1670
Abstract :
The authors describe proton irradiation tests and theoretical prediction programmes, mounted as part of the European Space Agency´s TRP project, to show the way in which damage in EEV scientific CCDs increases with time in space. The tests give hope that certain modifications of the chip, present in some of the samples tested, can alleviate the damage considerably. Radiation damage levels required with the passage of time in the XMM X-ray astronomy mission can now be stated. With fair confidence, one can now outline engineering measures to harden the system to minimize the space damage
Keywords :
charge-coupled device circuits; proton effects; radiation hardening (electronics); EEV scientific CCDs; ESA; TRP project; XMM X-ray astronomy mission; charge coupled devices; engineering measures; proton irradiation tests; space proton damage; Astronomy; Charge coupled devices; Energy resolution; Focusing; Protons; Space charge; Space technology; Spectroscopy; Telescopes; X-ray imaging;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.124160
Filename :
124160
Link To Document :
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