• DocumentCode
    818310
  • Title

    Critical temperatures of contact materials

  • Author

    Ding, Bingjun ; Li, Hongqun ; Wang, Xiaotian ; Wang, Jimei

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Xi´´an Jiaotong Univ., China
  • Volume
    15
  • Issue
    1
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    118
  • Lastpage
    120
  • Abstract
    The influence of cathode temperatures on the dielectric strength of contact materials is investigated in the temperature region between 300 and 1600 K. Experimental results show that contact materials investigated in this paper have certain critical temperatures. Below the critical temperatures, the dielectric strengths of the materials are equal to or greater than those at room temperature; but above the critical temperatures, the dielectric strengths decrease rapidly. The critical temperatures for CuSe and CuCr are about 1200 and 1300 K, respectively. The critical temperature for Cu is also 1200 K. The influence of temperature on dielectric strength is discussed
  • Keywords
    chromium alloys; circuit breakers; copper; copper alloys; electric breakdown; electric strength; electrical contacts; selenium alloys; vacuum insulation; 300 to 1600 K; Cu; CuCr; CuCr alloys; CuSe; CuSe alloys; cathode temperatures; contact materials; critical temperatures; dielectric strength; temperature region; vacuum interrupters; Anodes; Breakdown voltage; Cathodes; Dielectric breakdown; Dielectric materials; Dielectric measurements; Electric breakdown; Electrodes; Interrupters; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.124201
  • Filename
    124201