DocumentCode :
818591
Title :
Microdosimetry of the ultraviolet erasable programmable read-only memory experiment on the microelectronics and photonics test bed: recent advances in small-volume analysis
Author :
Scheick, L.Z. ; Blake, B. ; McNulty, P.J.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technology, Pasadena, CA, USA
Volume :
52
Issue :
6
fYear :
2005
Firstpage :
2300
Lastpage :
2306
Abstract :
A commercial ultraviolet erasable programmable read-only memory (UVPROM) was used to demonstrate a dosimetry technique for both ground and space applications. An equivalent amount of UV to reproduce the same amount of erasure was used to calibrate dose. The new method of readout, unlike other methods, does not require the evidence of exposure to be destroyed in the course of a measurement. It requires power only during readout. Results from an experiment using this technique aboard the Microelectronics and Photonics Test Bed (MPTB) satellite are discussed. Application of Extreme Value Theory is used to analyze whether early failures in the device were statistically feasible or more likely due to large, rare energy depositions. A new dosimeter approach using a change injection method that will eliminate the need for UV as a metric is also presented as well new experiments for the devices under test aboard MPTB.
Keywords :
EPROM; MOS memory circuits; dosimetry; integrated circuit testing; Extreme Value Theory; MPTB; Microelectronics/Photonics Test Bed satellite; UVPROM; dosimetry; extreme value analysis; floating gate; microdose; microdosimetry; rare energy deposition; single event; small-volume analysis; space application; stuck bit; transfer orbit; ultraviolet erasable programmable read-only memory; Chemicals; Digital integrated circuits; Electrons; Microelectronics; Nonvolatile memory; PROM; Photonics; Propulsion; Satellites; Testing; Extreme value; MPTB; NVM; UVPROM; extreme value analysis; extreme value theory; floating gate; microdose; non-volatile; satellite; single event; stuck bit; transfer orbit;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.860750
Filename :
1589199
Link To Document :
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