Title :
CuGeMn, a new material for high precision cryo-resistors
Author :
Warnecke, Peter ; Braun, Erich
Author_Institution :
Physikalisch-Technische Bundersanstalt
fDate :
4/1/1991 12:00:00 AM
Keywords :
Conductivity; Cryogenics; Electrical resistance measurement; Helium; Impurities; Manganese alloys; Temperature dependence; Temperature distribution; Thermal resistance; Welding;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032927