DocumentCode
818951
Title
The ultra-Zener- a portable replacement for the Western cell?
Author
Spreadbury, Peter J.
Author_Institution
Cambridge University
Volume
40
Issue
2
fYear
1991
fDate
4/1/1991 12:00:00 AM
Firstpage
343
Lastpage
346
Keywords
Aging; Assembly; Circuit testing; Integrated circuit noise; Low-frequency noise; Printed circuits; Semiconductor device measurement; Temperature; Thermal resistance; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1990.1032955
Filename
1032955
Link To Document