Correlation between noise-after-write and magnetization dynamics in thin film heads

Author

Liu, F.H. ; Ryan, P. ; Shi, X. ; Kryder, M.H.

Author_Institution

Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

2100

Lastpage

2102

Abstract

Correlation between noise-after-write and magnetization dynamics in 30-turn electroplated thin-film heads has been investigated by utilizing two complementary magnetooptic Kerr-effect domain imaging systems and a Barkhausen noise tester. It has been found that heads containing spike-like domains near the backgap closure have significantly higher noise-after-write rates than heads with normal closure domain configurations. A longitudinal 180° wall in the direction of flux conduction at the sloped region of the pole tip was observed, however, regardless of whether the head had a high or low noise-after-write rate

Keywords

Barkhausen effect; Kerr magneto-optical effect; electroplated coatings; magnetic domain walls; magnetic heads; magnetic thin film devices; noise; Barkhausen noise tester; backgap closure; closure domain configurations; electroplated heads; longitudinal 180° wall; magnetization dynamics; magnetooptic Kerr-effect domain imaging systems; noise-after-write; pole tip; spike-like domains; thin film heads; Kerr effect; Magnetic domain walls; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Magnetization; Magnetooptic effects; Transistors; Writing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179409

Filename

179409