Title :
A new universal calibration method for four-terminal-pair admittance standards
Author_Institution :
Yokogawa-Hewlett-Packard
fDate :
4/1/1991 12:00:00 AM
Keywords :
Admittance measurement; Calibration; Connectors; Current measurement; Displays; Frequency; Impedance measurement; Measurement standards; Standards development; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032975
