• DocumentCode
    819372
  • Title

    Built-in online and offline test of airborne digital systems

  • Author

    Savir, Jacob

  • Author_Institution
    Electr. & Comput. Eng. Dept., New Jersey Inst. of Technol., Newark, NJ, USA
  • Volume
    54
  • Issue
    3
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    965
  • Lastpage
    974
  • Abstract
    This paper studies the effects of both online and offline test during flight critical missions where safety is a major issue. The online test, in this context, is a test performed on a digital airborne system during some specified windows in time while it is still performing its intended task. An offline test is a test that is performed on the digital system once it is taken offline because of a suspected failure. Both the online and the offline tests are performed during flight. The difference between the two is that the offline test can be made more effective than an online test due to the longer amount of time available for testing. Moreover, the offline test may be designed to have diagnosis and repair capability built in. Upon successful repair, the faulty processor may be reconfigured back into the system. Even though both tests are important, we show that the online test is more important than the offline test in enhancing the mission reliability. This is a counter-intuitive result since system repairs are conducted offline.
  • Keywords
    aircraft control; avionics; built-in self test; integrated circuit reliability; integrated circuit testing; safety; airborne digital systems; built-in offline test; built-in online testing; flight critical missions; mission reliability; safety critical mission; Aerospace electronics; Aircraft; Airplanes; Digital systems; Electromagnetic interference; Electromagnetic radiation; Electromagnetic transients; Performance evaluation; Redundancy; System testing; Mission reliability; offline test; online test; semi-Markov chain;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2005.847342
  • Filename
    1433167