Title :
A high-speed IC random-number source for SmartCard microcontrollers
Author :
Bucci, Marco ; Germani, Lucia ; Luzzi, Raimondo ; Tommasino, Pasquale ; Trifiletti, Alessandro ; Varanonuovo, Mario
Author_Institution :
Dept. of Electron. Eng., Univ. of Rome, Italy
Abstract :
The design of a high-speed integrated circuit random number source macro-cell, suitable to be integrated in a SmartCard microcontroller, is presented. The direct amplification of a thermal-noise source is exploited and an accurate and low-area offset zeroing system has been developed in order to increase the statistical quality of the output bit sequences. Moreover, an analytical model has been developed, allowing the estimation of the output bit correlation as a function of the main circuit parameters. Using a standard 0.18-μm n-well CMOS process, a prototype has been fabricated and measured, obtaining a random behavior for an output data rate up to 40 Mb/s. The macro-cell area, excluding pads, is 0.025 mm2 (220 μm×116 μm) and its power consumption is about 3.6 mW when clocked at 10 MHz.
Keywords :
CMOS digital integrated circuits; high-speed integrated circuits; integrated circuit design; integrated circuit modelling; microcontrollers; random number generation; smart cards; thermal noise; 0.18 micron; 10 MHz; 3.6 mW; 40 Mbit/s; SmartCard microcontrollers; accurate low-area offset zeroing system; analytical model; direct amplification; high-speed IC random-number source; high-speed integrated circuit random number source macro-cell; n-well CMOS process; output bit correlation; output bit sequences; output data rate; power consumption; statistical quality; thermal-noise source; Analytical models; CMOS process; Cryptography; Hardware; High speed integrated circuits; Measurement standards; Microcontrollers; Noise generators; Prototypes; Random number generation;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
DOI :
10.1109/TCSI.2003.818610
