DocumentCode :
82035
Title :
A New Uniform Calibration Method for Double-Sided Silicon Strip Detectors
Author :
Rui Qiao ; Yanlin Ye ; Jing Wang ; Zhihuan Li ; Haibo You ; Zaihong Yang ; Biao Yang
Author_Institution :
State Key Lab. of Nucl. Phys. & Technol., Peking Univ., Beijing, China
Volume :
61
Issue :
1
fYear :
2014
fDate :
Feb. 2014
Firstpage :
596
Lastpage :
601
Abstract :
We proposed and implemented a new uniform calibration approach for double-sided silicon strip detector, named the self-calibration method (SCM). This method uses the strips on one side of the detector as references, to calibrate the strips on the other side, and vice versa. This calibration method has the inherent advantages that it can be run during the experiment corresponding exactly to the required particle type and energy range, and provides good statistics based on flexible selection of the event samples. Two strategies based on the same working principle but with deferent complexities, named simple SCM and overall SCM, were introduced and examined experimentally. The simple SCM requires less computation but a large number of events, while the overall SCM exhibits excellent performance even with a relatively small number of events.
Keywords :
calibration; silicon radiation detectors; SCM; detector side strip method; double-sided silicon strip detectors; energy range; event sample flexible selection; large event number; less computation; overall SCM excellent performance; particle type; relatively small event number; self-calibration method; simple SCM; strip calibration; uniform calibration approach; uniform calibration method; Calibration; Decision support systems; Detectors; Particle beams; Silicon; Strips; Uncertainty; Double-sided silicon strip detector; particle identification; self-calibration; uniform energy calibration;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2295519
Filename :
6728668
Link To Document :
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