• DocumentCode
    820753
  • Title

    100-GHz cooled amplifier residual PM and AM noise measurements, noise figure, and jitter calculations

  • Author

    Howe, David A. ; Ostrick, Jeffery R.

  • Author_Institution
    Time & Frequency Metrol. Group, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    51
  • Issue
    11
  • fYear
    2003
  • Firstpage
    2235
  • Lastpage
    2242
  • Abstract
    We report the first definitive PM and AM noise measurements at 100 GHz of indium phosphide (InP) amplifiers operating at 5 K, 77 K, and room temperature. Amplifier gain ranged from +7 to +30 dB, depending on input RF power levels and operating bias current and gate voltages. The measurement system, calibration procedure, and amplifier configuration are described along with strategies for reducing the measurement system noise floor in order to accurately make these measurements. We compute amplifier noise figure with an ideal oscillator signal applied and, based on the PM noise measurements, obtain NF=0.8 dB, or a noise temperature of 59 K. Measurement uncertainty is estimated at ±0.3 dB. Results show that the use of the amplifier with an ideal 100-GHz reference oscillator would set a lower limit on rms clock jitter of 44.2 fs in a 20-ps sampling interval if the power into the amplifier were -31.6 dBm. For comparison, clock jitter is 16 fs with a commercial room-temperature amplifier operating in saturation with an input power of -6.4 dBm.
  • Keywords
    III-V semiconductors; MMIC amplifiers; amplitude modulation; cryogenic electronics; electric noise measurement; field effect MIMIC; indium compounds; integrated circuit noise; measurement uncertainty; millimetre wave amplifiers; millimetre wave measurement; phase modulation; phase noise; timing jitter; 100 GHz; 100-GHz cooled amplifier; 5 to 295 K; 7 to 30 dB; InP; InP amplifiers; MMICs; amplifier configuration; amplifier gain; calibration procedure; gate voltages; ideal 100-GHz reference oscillator; ideal oscillator signal; input RF power levels; jitter; measurement system; measurement uncertainty; noise figure; operating bias current; phase modulation noise; residual AM noise measurements; residual PM noise measurements; rms clock jitter; saturation operation; spectral analysis; Clocks; Indium phosphide; Jitter; Noise figure; Noise measurement; Oscillators; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Temperature;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2003.818934
  • Filename
    1242986