• DocumentCode
    820802
  • Title

    The Influence of Dosimetry on Earlier Damage Equivalence Ratios

  • Author

    Coppage, F.N.

  • Author_Institution
    Sandia Laboratories, Albuquerque, New Mexico 87115
  • Volume
    22
  • Issue
    6
  • fYear
    1975
  • Firstpage
    2336
  • Lastpage
    2339
  • Abstract
    Since it was first noted that the experimental damage equivalence ratios for different neutron spectra obtained from change in transistor parameter behavior did not agree with the calculated ratios based on damage to silicon, an explanation has been sought for this apparent discrepancy. Investigations have included device processing techniques device geometry, and finally dosimetry. Careful dosimetry is of the utmost importance to these ratio measurements. Recently extensive studies of the White Sands Fast Burst Reactor (FBR), which is identical to the Sandia Pulsed Reactor (SPR-II), yielded information which suggested that a significant error was possible in the SPR-II dosimetry utilized in earlier studies. A test group at SAl726 (2N4251) transistors were used to make a comparison of the spectrum from the FBR and the SPR-II. The results of the device study showed a difference of 25-30 percent in fluence measured by Sandia dosimetry and by White Sands dosimetry for a given FBR exposure. This difference was for a 10 KeV energy threshold. These findings prompted an investigation of the Sandia dosimetry techniques used at SPR-II. This investigation showed, on the basis of dosimetry measurements excluding fission foils, that the 10 KeV/3 MeV ratio for SPR-II was 7.5 instead of 10 as presently used. The correction in dosimetry from SPR-II when applied to earlier damage equivalence ratios changes the 14 MeV-to-SPR-II damage ratio from 4.2 to approximately 2.9. This value (2.9) is in good agreement with other experimenters and calculations based on displacement damage in silicon.
  • Keywords
    Automatic control; Current measurement; Dosimetry; Energy measurement; Geometry; Inductors; Laboratories; Neutrons; Silicon; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1975.4328129
  • Filename
    4328129