• DocumentCode
    820876
  • Title

    Transient current off-chip sensor circuit for digital IC production testing

  • Author

    Alorda, B. ; Bloechel, B. ; Keshavarzi, A. ; Segura, J.

  • Author_Institution
    Dept. de Fisica, Univ. de les Illes Baleares, Palma de Mallorca, Spain
  • Volume
    38
  • Issue
    18
  • fYear
    2002
  • fDate
    8/29/2002 12:00:00 AM
  • Firstpage
    1028
  • Lastpage
    1029
  • Abstract
    An off-chip monitor is presented that measures the transient supply current of CMOS ICs and provides the charge delivered to the circuit. The monitor is designed to be placed on the automatic test equipment board fixture and automate transient current supply testing. Experimental results demonstrate up to 1 GHz bandwidth operation
  • Keywords
    CMOS digital integrated circuits; automatic testing; condition monitoring; electric current measurement; electric sensing devices; integrated circuit testing; production testing; transients; 1 GHz; ATE board fixture; CMOS ICs; automatic test equipment fixture; digital IC production testing; off-chip monitor; off-chip sensor circuit; transient current sensor circuit; transient current supply testing; transient supply current;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20020694
  • Filename
    1033252