• DocumentCode
    822022
  • Title

    Efficient modeling of microwave integrated-circuit geometries via a dynamically adaptive mesh Refinement-FDTD technique

  • Author

    Liu, Yaxun ; Sarris, Costas D.

  • Author_Institution
    Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
  • Volume
    54
  • Issue
    2
  • fYear
    2006
  • Firstpage
    689
  • Lastpage
    703
  • Abstract
    The finite-difference time-domain (FDTD) method is combined with an adaptive mesh refinement (AMR) technique, to achieve a fast, time-domain solver for Maxwell´s equations (AMR-FDTD), based on a three-dimensional moving/rotating Cartesian mesh. This combination allows the proposed solver to adapt to the problem at hand, optimally distributing computational resources in a given domain as needed, by recursively refining a coarse grid in regions of large over time gradient of electromagnetic field energy. Several applications of the method to the analysis of microwave circuit geometries demonstrate its salient features and its outstanding efficiency as a microwave computer-aided design tool.
  • Keywords
    Maxwell equations; circuit CAD; finite difference time-domain analysis; gradient methods; integrated circuit design; integrated circuit modelling; mesh generation; microwave integrated circuits; 3D Cartesian mesh; Maxwell equations; adaptive mesh refinement; coarse grid definition; electromagnetic field energy gradient; finite-difference time-domain method; microwave circuit geometries; microwave computer-aided design tool; microwave integrated circuit modeling; time-domain solver; Adaptive mesh refinement; Distributed computing; Electromagnetic fields; Finite difference methods; Geometry; Grid computing; Maxwell equations; Microwave theory and techniques; Solid modeling; Time domain analysis; Adaptive mesh refinement (AMR); finite difference time domain (FDTD); microwave integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.862660
  • Filename
    1589493