• DocumentCode
    822720
  • Title

    Low dark current GaN Schottky UV photodiodes using oxidised IrNi Schottky contact

  • Author

    Jiang, H. ; Egawa, T. ; Ishikawa, H. ; Dou, Y.B. ; Shao, C.L. ; Jimbo, T.

  • Author_Institution
    Res. Center for Nano-Devices & Syst., Nagoya Inst. of Technol., Japan
  • Volume
    39
  • Issue
    22
  • fYear
    2003
  • Firstpage
    1604
  • Lastpage
    1606
  • Abstract
    Ir/Ni/Ir metallisation was employed as Schottky contacts of GaN Schottky photodiodes. After annealing at 500°C in O2 for 1 min, the Schottky contact achieved the maximum barrier height of 1.28 eV and the minimum dark current densities of 1.8×10-10 A/cm2 at -5 V bias. The peak responsivity is 105 mA/W at zero bias and increases to 150 mA/W at -15 V bias. The detectivity was estimated as 5.8×1015 cmHz12/ W-1 at zero bias.
  • Keywords
    III-V semiconductors; Schottky diodes; annealing; current density; dark conductivity; gallium compounds; photodiodes; semiconductor device metallisation; -5 to -15 V; 1 min; 1.28 eV; 500 degC; GaN; Ir-Ni-Ir-GaN; Schottky UV photodiodes; annealing; current densities; dark current; maximum barrier height; oxidised IrNi Schottky contact; peak responsivity;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20031039
  • Filename
    1244127