• DocumentCode
    823341
  • Title

    VUV-Spectroscopy of Multiply Charged Ion Source-Plasmas

  • Author

    Bruck, M. ; Bruckmuller, R. ; Hertenberger, G. ; Winter, H.

  • Author_Institution
    Institut fÿr Allgemeine Physik, Technische Universitat, Vienna/Austria
  • Volume
    23
  • Issue
    2
  • fYear
    1976
  • fDate
    4/1/1976 12:00:00 AM
  • Firstpage
    967
  • Lastpage
    970
  • Abstract
    The ion charge state distribution (CSD) in a multiply charged ion source- (MCIS-) plasma can be determined from the spectrum of resonance transitions of excited neutral and ionised plasma particles. The principle of this method, which for noble gas ions involves vacuum-ultraviolet spectroscopy, is described and first measurements for a DUOPLASMATRON-ion source operated with He and Ar are presented.
  • Keywords
    Electron optics; Ion beams; Ion sources; Plasma applications; Plasma confinement; Plasma density; Plasma measurements; Plasma sources; Resonance; Stationary state;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1976.4328384
  • Filename
    4328384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=823341