• DocumentCode
    823720
  • Title

    Theoretical calculations and performance results of a PZT thin film actuator

  • Author

    Hoffmann, Marcus ; Kuppers, H. ; Schneller, Theodor ; Bottger, Ulrich ; Schnakenberg, Uwe ; Mokwa, Wilfried ; Waser, Rainer

  • Author_Institution
    Electroceramic Mater. Res. Labs., RWTH, Aachen, Germany
  • Volume
    50
  • Issue
    10
  • fYear
    2003
  • Firstpage
    1240
  • Lastpage
    1246
  • Abstract
    High piezoelectric coupling coefficients of PZT-based material systems can be employed for actuator functions in micro-electro-mechanical systems (MEMS) offering displacements and forces which outperform standard solutions. This paper presents simulation, fabrication, and development results of a stress-compensated, PZT-coated cantilever concept in which a silicon bulk micromachining process is used in combination with a chemical solution deposition (CSD) technique. Due to an analytical approach and a finite element method (FEM) simulation for a tip displacement of 10 /spl mu/m, the actuator was designed with a cantilever length of 300 /spl mu/m to 1000 /spl mu/m. Special attention was given to the Zr/Ti ratio of the PZT thin films to obtain a high piezoelectric coefficient. For first characterizations X-ray diffraction (XRD), scanning electron microscopy (SEM), hysteresis-, current-voltage I(V)and capacitance-voltage C(V)-measurements were carried out.
  • Keywords
    X-ray diffraction; finite element analysis; lead compounds; liquid phase deposited coatings; microactuators; micromachining; piezoelectric actuators; piezoelectric thin films; scanning electron microscopy; MEMS cantilever; PZT; PZT thin film actuator; PbZrO3TiO3; Si; X-ray diffraction; capacitance-voltage characteristics; chemical solution deposition; current-voltage characteristics; finite element method; hysteresis; piezoelectric coupling coefficient; scanning electron microscopy; silicon bulk micromachining; stress compensation; Fabrication; Microelectromechanical systems; Micromachining; Micromechanical devices; Piezoelectric actuators; Piezoelectric films; Piezoelectric materials; Scanning electron microscopy; Silicon; Transistors;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2003.1244739
  • Filename
    1244739