• DocumentCode
    82431
  • Title

    A 0.5-V 5.2-fJ/Conversion-Step Full Asynchronous SAR ADC With Leakage Power Reduction Down to 650 pW by Boosted Self-Power Gating in 40-nm CMOS

  • Author

    Sekimoto, Ryota ; Shikata, Akira ; Yoshioka, Kazuaki ; Kuroda, Tadahiro ; Ishikuro, Hiroki

  • Author_Institution
    Keio Ishikuro Lab., Yokohama, Japan
  • Volume
    48
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    2628
  • Lastpage
    2636
  • Abstract
    This paper presents an ultralow-power and ultralow-voltage SAR ADC. Full asynchronous operation and boosted self-power gating are proposed to improve conversion accuracy and reduce static leakage power. By designing with MOSFET of high threshold voltage (HVt) and low threshold voltage (LVt), the leakage power is reduced without decrease of maximum sampling frequency. The test chip in 40-nm CMOS process has successfully reduced leakage power by 98%, and it achieves 8.2-bit ENOB and while consuming only 650 pW at 0.1 kS/s from 0.5-V power supply. The power consumption is scalable up to 4 MS/s and power supply range from 0.4 to 0.7 V. The best figure of merit at 0.5 V is 5.2 fJ/conversion-step at 20 kS/s.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; asynchronous circuits; low-power electronics; CMOS; boosted self-power gating; conversion accuracy; full asynchronous SAR ADC; leakage power reduction; power 650 pW; power consumption; size 40 nm; static leakage power; ultralow-power SAR ADC; ultralow-voltage SAR ADC; voltage 0.4 V to 0.7 V; word length 8.2 bit; CMOS integrated circuits; Clocks; Delays; Leakage currents; MOSFET; Power demand; Switches; Asynchronous; data converter; leakage power; low-power; low-voltage; power gating; successive-approximation-register (SAR) ADC;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2274851
  • Filename
    6578607