Title :
Analytical Photo-Compton Deposition Profiles
Author :
Dellin, T.A. ; MacCallum, C.J.
Author_Institution :
Sandia Laboratories Livermore, California 94550
Keywords :
Attenuation; Electron beams; Electron emission; Elementary particle vacuum; Information analysis; Laboratories; Monte Carlo methods; Physics; Structural shells; Surface treatment;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1976.4328588
