Charge Deposition Profiles near Irradiated Material Interfaces

Charge deposition profiles in thin planar layers of aluminum, tin and tantalum next to various combinations of thick layers of aluminum, copper, tin and lead have been measured under cobalt 60 irradiation. The gamma ray beam is collimated and its energy spectrum is measured. The gamma intensity is accurately determined so that the absolute charge deposition can be related to the gamma beam intensity and spectrum. The geometry is one dimensional slab. Data is tabulated for 44 combinations of the various materials allowing for extensive comparison with computer calculations.