DocumentCode :
825482
Title :
Parameter estimation of incomplete data in competing risks using the EM algorithm
Author :
Park, Chanseok
Author_Institution :
Dept. of Math. Sci., Clemson Univ., SC, USA
Volume :
54
Issue :
2
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
282
Lastpage :
290
Abstract :
Consider a system which is made up of multiple components connected in a series. In this case, the failure of the whole system is caused by the earliest failure of any of the components, which is commonly referred to as competing risks. In certain situations, it is observed that the determination of the cause of failure may be expensive, or may be very difficult to observe due to the lack of appropriate diagnostics. Therefore, it might be the case that the failure time is observed, but its corresponding cause of failure is not fully investigated. This is known as masking. Moreover, this competing risks problem is further complicated due to possible censoring. In practice, censoring is very common because of time and cost considerations on experiments. In this paper, we deal with parameter estimation of the incomplete lifetime data in competing risks using the EM algorithm, where incompleteness arises due to censoring and masking. Several studies have been carried out, but parameter estimation for incomplete data has mainly focused on exponential models. We provide the general likelihood method, and the parameter estimation of a variety of models including exponential, s-normal, and lognormal models. This method can be easily implemented to find the MLE of other models. Exponential and lognormal examples are illustrated with parameter estimation, and a graphical technique for checking model validity.
Keywords :
exponential distribution; failure analysis; graph theory; life testing; log normal distribution; maximum likelihood estimation; reliability theory; risk analysis; EM algorithm; MLE; censoring; competing risk; exponential model; failure analysis; failure time; general likelihood method; graphical technique; incomplete data parameter estimation; incomplete lifetime data; lognormal model; masking; model validity checking; multiple component; s-normal model; whole system failure; Costs; Distribution functions; Failure analysis; Hazards; Helium; Life estimation; Lifetime estimation; Maximum likelihood estimation; Parameter estimation; Probability density function; Censoring; EM algorithm; MLE; competing risks; likelihood function; masking; missing data;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2005.846360
Filename :
1435721
Link To Document :
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