• DocumentCode
    825537
  • Title

    Repairable consecutive-k-out-of-n: G systems with r repairmen

  • Author

    Wu, Yueqin ; Guan, Jiancheng

  • Author_Institution
    Sch. of Manage., Beijing Univ. of Aeronaut. & Astronaut., China
  • Volume
    54
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    328
  • Lastpage
    337
  • Abstract
    In this paper, we study repairable consecutive-k-out-of-n: G systems with r repairmen. The systems are either circular or linear. It is assumed that the working time, and the repair time of each component in the system are both exponentially distributed; and every component after repair is ´as good as new´. Each component is classified as either a key component, or an ordinary one according to its priority role to the system´s repair. By using the definition of generalized transition probability, the state transition probabilities of the system are derived. Some important indices related to repairmen are obtained, and some reliability indices are derived by using the Laplace transform technique. Numerical examples are then studied in detail to demonstrate the theoretical results developed in the paper. The proposed method, and its numerical illustrations for the examples verify the validity & generality of the studied system.
  • Keywords
    Laplace transforms; consecutive system reliability; exponential distribution; maintenance engineering; Laplace transform technique; exponential distribution; generalized transition probability; reliability indices; repairable consecutive-k-out-of-n: G system; repairmen; state transition probabilities; system repair; Circuit synthesis; Circuit testing; Design engineering; Helium; Laplace equations; Probability; Qualifications; Reliability engineering; State-space methods; System testing; Generalized transition probability; key components; reliability; repairable consecutive-k-out-of-n: G system;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2005.847250
  • Filename
    1435727