• DocumentCode
    825652
  • Title

    On priorities of cathode and anode contaminations in triggering the short-pulsed voltage breakdown in vacuum

  • Author

    Batrakov, A.V. ; Onischenko, S.A. ; Proskurovsky, D.I. ; Johnson, D.J.

  • Author_Institution
    Inst. of High Current Electron. SD RAS, Tomsk, Russia
  • Volume
    13
  • Issue
    1
  • fYear
    2006
  • Firstpage
    41
  • Lastpage
    51
  • Abstract
    Modern theoretical notations on electrical breakdown in vacuum consider cathode triggering mechanisms to be most responsible on short-pulsed (<1 μs) breakdowns while anode mechanisms to be responsible in a part on DC and long-pulsed breakdowns. Following those notations, we tried to reveal conditions at which either mechanism steps aside to another one. The study involved several experimental techniques including the anode-probe surface scanning, pulsed electron-beam surface melting in vacuum for surface cleaning, and intentional dust particle contamination of electrode surfaces. Breakdown tests were performed using a pulser capable of producing 220 kV quasi-square pulses that were adjustable to ∼30 to 80 ns pulse length. Our experiments showed that cathode emission sites are responsible for breakdowns at relatively low hold-off fields. At higher electric fields of up to 1 MV/cm, the anode share in the mechanism of triggering breakdown becomes probably more significant than the cathode mechanism.
  • Keywords
    anodes; cathodes; electric fields; surface cleaning; vacuum breakdown; voltage measurement; anode; cathode; electric field; electrical breakdown; electrode surface; pulsed electron-beam; quasi-square pulse; short-pulsed voltage; surface cleaning; surface melting; surface scanning; vacuum breakdown; vacuum insulation; vacuum measurement; Anodes; Cathodes; Dielectric breakdown; Electric breakdown; Electrodes; Surface cleaning; Surface contamination; Testing; Vacuum breakdown; Vacuum technology;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2006.1593400
  • Filename
    1593400