• DocumentCode
    825704
  • Title

    The relation of trap distribution of alumina with surface flashover performance in vacuum

  • Author

    Li, Cheng Rong ; Ding, Li Jian ; Lv, Jin Zhuang ; Tu, You Ping ; Cheng, Yang Chun

  • Author_Institution
    Beijing Key Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China
  • Volume
    13
  • Issue
    1
  • fYear
    2006
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    Alumina ceramic samples prepared under different sintering temperatures and varied additives were measured to indicate the trap density and trap energy located in alumina materials by using thermally stimulated current (TSC). The surface charges on alumina in vacuum after applying a negative pulse voltage (0.7/4 μs), and flashover performances of the materials in vacuum also were measured. We found that the trap distribution in alumina has a correlation with surface charges and flashover performances in vacuum. It is shown that the higher is the trap density in the material, the higher is the surface charge density, and the lower is the flashover voltage on alumina surface. It is believed that the trapping and de-trapping mechanisms of carriers could play an important role during the development of the discharge processes, together with the secondary electron emission mechanism.
  • Keywords
    alumina; correlation methods; flashover; secondary electron emission; sintering; surface discharges; thermally stimulated currents; vacuum measurement; alumina ceramic sample; alumina materials; correlation; de-trapping mechanism; secondary electron emission; sintering temperature; surface charge density; thermally stimulated current; trap density; trap distribution; trap energy; vacuum surface flashover; Additives; Ceramics; Current measurement; Density measurement; Electron traps; Flashover; Pulse measurements; Surface discharges; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2006.1593404
  • Filename
    1593404