Analog circuit fault diagnosis based on sensitivity computation and functional testing

Author

Slamani, Mustapha ; Kaminska, Bozena

Author_Institution

Ecole Polytech. de Montreal, Que., Canada

Volume

9

Issue

1

fYear

1992

fDate

3/1/1992 12:00:00 AM

Firstpage

30

Lastpage

39

Abstract

An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.<>

Keywords

circuit analysis computing; fault location; linear integrated circuits; sensitivity analysis; analogue ICs; analogue circuit fault diagnosis; defective elements; diagnostic resolution; functional testing; output parameters; sensitivity computation; sensitivity matrix; test equations; Analog circuits; Analog computers; Automatic testing; Circuit faults; Circuit testing; Digital circuits; Fault diagnosis; Frequency measurement; Pulse measurements; System testing;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/54.124515

Filename

124515