On test [electronic device testing]

With electronic devices and components getting smaller and smaller, accurate, reliable test systems are becoming more of a challenge that designers must take seriously. 2 methods are described. Electrical testing is technically very difficult to set up, but devices that have been designed to Joint Test Action Group (JTAG) standards are provided with a boundary scan description language (BDSL) file, which gives test engineers a head start. SPEAs solution is a flying probe hybrid test platform that also has AOI functionality This provides benefits to users in a number of ways. Manufacturers no longer have to choose between investing in flying probe or AOI, as they can be afforded economical access to both methods.