• DocumentCode
    825930
  • Title

    Equipment Throughput Optimization by Means of Speed Loss Analysis

  • Author

    Foster, Jason ; Matthews, John ; Beaumont, Preston ; Zarbock, Thomas ; Yeo, Danny

  • Author_Institution
    Qimonda AG, Sandston, VA
  • Volume
    21
  • Issue
    3
  • fYear
    2008
  • Firstpage
    371
  • Lastpage
    375
  • Abstract
    Consistent with the semiconductor industry´s focus on continuous improvement, increased throughput, and shorter cycle times, this paper describes a methodology for the qualification and quantification of speed loss at a toolset level. The identification and quantification of the speed loss categories, along with implementation of specific actions targeted at these losses, has enabled our fab to have a direct impact on overall capacity and throughput performance of our toolsets.
  • Keywords
    semiconductor device manufacture; equipment throughput optimization; speed loss analysis; toolset level; Availability; Continuous improvement; Helium; Lithography; Performance loss; Qualifications; Steady-state; Throughput; Time measurement; Velocity measurement; Cascade; cascade train; overall equipment effectiveness (OEE); raw tool time (RTT); recipe train; speed loss; steady state speed; takt time;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2008.2001212
  • Filename
    4589030