• DocumentCode
    82698
  • Title

    Characterizations of Cu/Sn–Zn Solder/Ag Interfaces on Photovoltaic Ribbon for Silicon Solar Cells

  • Author

    Kuan-Jen Chen ; Fei-Yi Hung ; Truan-Sheng Lui ; Li-Hui Chen ; Yu-Wen Chen

  • Author_Institution
    Instrum. Center, Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    5
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    202
  • Lastpage
    205
  • Abstract
    Sn-xZn (x = 9, 25, and 50 wt%) alloy solders are applied in photovoltaic (PV) ribbon and connected with silicon solar cells. The interfacial microstructures, series resistance, and bonding strength of Sn-xZn PV modules are investigated. Cu5Zn8 and AgZn3 intermetallic compounds (IMCs) were found at the interfaces. The Zn content in the solder dominates the growth behavior of IMCs at the interface. The thickness of the Cu5Zn8 and AgZn3 IMC layer increased with increasing Zn content in the solder, and thus, the series resistance of the PV module also increased. The growth of IMCs can enhance the interfacial adhesion strength, but excess Zn overconsumes the Ag electrode, reducing the bond strength of the PV module. Applying low-Zn-content Sn- xZn solder to PV ribbon avoids overconsumption of the Ag layer and, thus, decreases the series resistance and internal stress.
  • Keywords
    adhesion; copper; crystal microstructure; electrical resistivity; elemental semiconductors; interface structure; internal stresses; silicon; silver; solar cells; solders; tin alloys; zinc alloys; Cu-SnZn-Ag-Si; PV modules; alloy solders; bonding strength; electrode; interfacial adhesion strength; interfacial microstructure; intermetallic compound layer thickness; internal stress; photovoltaic ribbon; series resistance; silicon solar cells; Electrodes; Microstructure; Photovoltaic cells; Photovoltaic systems; Resistance; Zinc; Bonding strength; Sn-xZn solder; intermetallic compounds (IMCs); internal stress; photovoltaic (PV) ribbon;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2014.2373822
  • Filename
    6979227