DocumentCode
82731
Title
Development and Validation of the Electron Slot Region Radiation Environment Model
Author
Sandberg, I. ; Daglis, I.A. ; Heynderickx, Daniel ; Truscott, Pete ; Hands, A. ; Evans, Hugh ; Nieminen, Petteri
Author_Institution
Inst. for Astron., Astrophys., Space Applic. & Remote Sensing, Nat. Obs. of Athens, Penteli, Greece
Volume
61
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
1656
Lastpage
1662
Abstract
In this work we present the development of the electron Slot Region Radiation Environment Model (e-SRREM). e-SRREM is a data-based statistical model which has been built on fifteen years of electron flux measurements. The model describes the trapped electron radiation in a region that includes the slot region between the inner and the outer electron radiation belts. The model provides energetic electron fluxes with their uncertainties determined by confidence levels for user-defined mission orbit and duration. First comparisons of e-SRREM with the AE8 and International Radiation Environment Near Earth (IRENE) AE9 models show that the aforementioned models underestimate the electron flux levels along highly elliptic orbit that crosses the slot region. Extensive testings and comparisons will follow in future work.
Keywords
radiation belts; statistical analysis; AE8 model; International Radiation Environment Near Earth AE9 model; confidence levels; data-based statistical model; e-SRREM; electron Slot Region Radiation Environment Model; electron flux levels; electron flux measurements; elliptic orbit; energetic electron fluxes; inner electron radiation belt; outer electron radiation belt; trapped electron radiation; user-defined mission duration; user-defined mission orbit; Atmospheric measurements; Belts; Electron traps; Extraterrestrial measurements; Histograms; Orbits; Space vehicles; Electrons; radiation belts; radiation monitoring; semiconductor radiation detectors; solar system; space charge; sun;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2014.2304982
Filename
6799309
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