• DocumentCode
    827435
  • Title

    High-Temperature Measurements of Q-Factor in Rotated X-Cut Quartz Resonators

  • Author

    Fritz, I.J.

  • Author_Institution
    Sandia National Laboratories, Albuquerque, NM 87185.
  • Issue
    2
  • fYear
    1982
  • fDate
    5/1/1982 12:00:00 AM
  • Firstpage
    158
  • Lastpage
    160
  • Abstract
    The Q-factors of piezoelectric resonators fabricated from natural and synthetic quartz with a 34° rotated X-cut orientation have been measured at temperatures up to 325°C. The synthetic material, which was purified by electrolysis, retains a high enough Q to be suitable for high-temperature pressure-transducer applications, whereas the natural quartz is excessively lossy above ~200°C application. The present results are compared to results obtained previously at AT-cut resonators.
  • Keywords
    Frequency; Pressure gauges; Q factor; Q measurement; Resistors; Resonance; Rotation measurement; Temperature distribution; Temperature measurement; Voltmeters;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.1982.356655
  • Filename
    4180384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=827435