DocumentCode :
827435
Title :
High-Temperature Measurements of Q-Factor in Rotated X-Cut Quartz Resonators
Author :
Fritz, I.J.
Author_Institution :
Sandia National Laboratories, Albuquerque, NM 87185.
Issue :
2
fYear :
1982
fDate :
5/1/1982 12:00:00 AM
Firstpage :
158
Lastpage :
160
Abstract :
The Q-factors of piezoelectric resonators fabricated from natural and synthetic quartz with a 34° rotated X-cut orientation have been measured at temperatures up to 325°C. The synthetic material, which was purified by electrolysis, retains a high enough Q to be suitable for high-temperature pressure-transducer applications, whereas the natural quartz is excessively lossy above ~200°C application. The present results are compared to results obtained previously at AT-cut resonators.
Keywords :
Frequency; Pressure gauges; Q factor; Q measurement; Resistors; Resonance; Rotation measurement; Temperature distribution; Temperature measurement; Voltmeters;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.1982.356655
Filename :
4180384
Link To Document :
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