DocumentCode
829427
Title
A 2.5-Gb/s Multi-Rate 0.25-
m CMOS Clock and Data Recovery Circuit Utilizing a Hybrid Analog/Digital Loop Filter and All-Digital Referenceless Frequency Acquisition
Author
Perrott, Michael H. ; Huang, Yunteng ; Baird, Rex T. ; Garlepp, Bruno W. ; Pastorello, Douglas ; King, Eric T. ; Yu, Qicheng ; Kasha, Dan B. ; Steiner, Philip ; Zhang, Ligang ; Hein, Jerrell ; Del Signore, Bruce
Author_Institution
Silicon Labs., Austin, TX
Volume
41
Issue
12
fYear
2006
Firstpage
2930
Lastpage
2944
Abstract
A 0.25-mum CMOS, multi-rate clock and data recovery (CDR) circuit that leverages unique analog/digital boundaries in its phase detector and loop filter to achieve a fully integrated CDR implementation with excellent performance, compact area, and low power dissipation is presented. Key circuit blocks include a phase-to-digital converter that combines a Hogge detector with a continuous-time first-order Sigma-Delta analog-to-digital converter, and a hybrid loop filter that contains an analog feedforward path and digital integrating path. In addition, an all-digital frequency acquisition method that does not require a reference frequency, quadrature phases from the VCO, or a significant amount of high-speed logic is presented. A nice byproduct of the frequency acquisition circuitry is that it also provides an estimate of the bit error rate (BER) experienced by the CDR. The CDR exceeds all SONET performance requirements at 155-, 622-, and 2500-Mb/s as well as Gigabit Ethernet specifications at 1.25 Gb/s. The chip operates with either a 2.5- or 3.3-V supply, consumes a maximum of 197 mA across all data rates, and fits in a 5times5 mm package
Keywords
analogue-digital conversion; error statistics; phase detectors; synchronisation; 0.25 micron; 197 mA; 2.5 V; 3.3 V; 5 mm; CMOS clock and data recovery circuit; Hogge detector; SONET; all-digital frequency acquisition method; all-digital referenceless frequency acquisition; analog feedforward path; bit error rate; continuous-time first-order Sigma-Delta analog-to-digital converter; digital integrating path; hybrid analog/digital loop filter; integrated loop filter; mixed-signal; phase detector; phase-locked loop; phase-to-digital converter; Analog-digital conversion; Bit error rate; CMOS analog integrated circuits; CMOS digital integrated circuits; Clocks; Detectors; Digital filters; Frequency estimation; Phase detection; Power dissipation; Analog-to-digital; SONET; Sigma-Delta; bit error rate (BER); clock and data recovery (CDR); frequency acquisition; hybrid loop filter; integrated loop filter; mixed-signal; multi-rate; phase-locked loop (PLL); phase-to-digital; referenceless;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2006.884391
Filename
4014630
Link To Document